printlogo
http://www.ethz.ch/index_EN
Electron Microscopy Center of the ETH Zurich (EMEZ)
 
print
  

Winter School 2010

Date Organized By: Title Flyer
       
17.-22 January 2010 Gabor Csucs
Light Microscopy Center, ETH Zurich

Urs Ziegler, Andreas Kaech
Center for Microscopy and Image Analysis University of Zurich

Roger Wepf
Electron Microscopy ETH Zurich

Practical Course in 3D light and electron microscopy
2010_WS_3DMicroscopy

Winterschool 2010 Jan 17th-22th

Practical course in advanced microscopy in Zürich, 17. - 22. 1. 2010

This advanced microscopy course is intended for PhD students and post-graduates with prior experience in microscopy. The goal of the course is to teach and train fundamental knowledge and skills in a specific microscopic technique.
Students will be able to apply this technique to their own present and future projects. Practical work consists of six different practical modules covering a specific topic each (please see description below). Each module lasts throughout the whole course. Students will participate in one practical module only. For the practical training the students will use the latest instrumentation. Apart from practical modules, theoretical sessions will provide sound background of all the different techniques for all students. These sessions are also open for other interested listeners, which have registered in advance.

Our Industry Day on Wednesday, January 20th, features an overview of the latest developments in instrumentation and techniques currently on the market. The preliminary schedule will be published soon.

Interested in this course – than please hand in your application with a short description of your current work and the preferences for a practical block until the 15th November 2010 under >> Link to Application Form Winter School 2010

Industry day: 20.01.10, 8.30 - 17, ETH Zurich, HCI.

Credit Points: The course is awarded 2 ECTS credit points

Modules 1-7:

Module 1: High resolution light microscopy (12 students)

This module will focus on the acquisition of well-resolved light microscopic images using different types of light microscopes (confocal laser scanning microscopes, structured illumination microscopes, wide field microscopes). Exercises and training sessions will provide an understanding of the different imaging characteristics of the various microscopes. You will study advantages / disadvantages of different immersion media as well as objectives for your samples. Moreover, you will learn to measure point spread functions, to deconvolve data sets and to perform 3D image processing. Samples will be provided.

Module 2: Life Cell Microscopy (6 students)

The second module will focus on time-lapse measurements using living cells. Special emphasis will be given to long-term investigations using both mainly wide-field and confocal systems. The participants will learn how to set-up, design and analyse such overnight experiments. You may bring along your own samples.

Module 3: Fine structure preparation for transmission electron microscopy (6 students)

In this module you will learn how to prepare plastic-embedded biological specimens by chemical and cryo preparation techniques (high-pressure freezing, freeze-substitution) with preservation of the fine structure. Embedded samples will be thin-sectioned by ultramicrotomy, contrasted and imaged in the transmission electron microscope. You can bring your own samples.

Module 4: Immuno electron microscopy (6 students)

In this module you will learn how to section plastic-embedded biological specimens and how to perform all subsequent steps required for immunolabeling of plastic-embedded ultrathin sections including validation by light and transmission electron microscopy. Samples will be provided.

Module 5: Correlative Microscopy I (6 students)

From 3D LM structure to 3D EM structure. This module will teach the basics of methodology and preparation techniques needed to perform light and electron microscopic investigations on identical / same sample areas by confocal laser scanning microscopy (CLSM) and focused ion beam scanning electron microscopy (FIB/SEM), as well as transmission electron microscopy (TEM). You will learn to collect correlative data sets from one ROI in 2D and 3D using the described imaging techniques, and get a better understanding of the different image characteristics. Further you will learn to correlate the different image types with software tools to finally align multimodal data in 3D and create 3D models. Samples will be provided.

Module 6: Correlative Microscopy II (6 students)

From 3D in-vivo structure to 3D SEM structure (FLM, CLSM, array tomography SEM). This module will teach the basics of methodology and preparation techniques needed to perform light and electron microscopic investigations on identical / same sample areas. You will learn to collect 2D and 3D data by fluorescence light microscopy (FLM), CLSM and SEM and get a better understanding of the different image characteristics. Further you will use immuno-cytochemistry to localize antigens on array tomography serial sections for FLM and SEM. Finally you learn to correlate the different image types with software tools to finally align multimodal data and antigen maps in 3D. Samples will be provided.

Module 7: CryoTEM and S(T)EM Tomography (6 students)

Module 7 will focus on understanding modern tomography techniques in EM, e.g. TEM and STEM tomography and focused SEM array tomography. You will learn how to prepare samples for cryoTEM and STEM tomography and collect serial sections of embedded biological material or tilt series of frozen hydrated or thin sections. You will explore the possibility of these new 3D imaging technologies and learn how 3D datasets can be reconstructed and used to produce 3D models. Samples will be provided.

Organization:

Urs Ziegler, Andres Kaech, Center for Microscopy and Image Analysis, University of Zürich
Gabor Csucs, LMC, Light Microscopy Centre ETH Zürich
Roger Wepf, EMEZ, Electron Microscopy ETH Zürich

>> Link to Application Form Winter School 2010

Deadline:15th November 2009

 

Winter School is sponsored by:

 

skmb
olymp
Leica
Nikon
feiLogo
zeisslogo
cimst
 
 

Wichtiger Hinweis:
Diese Website wird in älteren Versionen von Netscape ohne graphische Elemente dargestellt. Die Funktionalität der Website ist aber trotzdem gewährleistet. Wenn Sie diese Website regelmässig benutzen, empfehlen wir Ihnen, auf Ihrem Computer einen aktuellen Browser zu installieren. Weitere Informationen finden Sie auf
folgender Seite.

Important Note:
The content in this site is accessible to any browser or Internet device, however, some graphics will display correctly only in the newer versions of Netscape. To get the most out of our site we suggest you upgrade to a newer browser.
More information

© 2012 ETH Zurich | Imprint | Disclaimer | 17 October 2011
top